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検索キーワード:(件名: #Electron microscopy)
該当件数:16件
Procedures in electron microscopy / principle editors, A. W. Robards, A. J. Wilson
Chichester : J. Wiley , c1993
図書
The principles and practice of electron microscopy / Ian M. Watt
2nd ed.. - Cambridge [Cambridgeshire] : Cambridge University Press , c1997
Electron energy-loss spectroscopy in the electron microscope / R. F. Egerton
New York : Plenum Pr. , c1986
Electron microscopy and analysis 1997 : proceedings of the Institute of Physics Electron Microscopy and Analysis Group conference, Cavendish Laboratory, University of Cambridge, 2-5 September 1997 / edited by J. M. Rodenburg
Bristol : Institute of Physics Pub. , c1997. - Philadelphia. - (Institute of Physics conference series ; no. 153)
Advanced computing in electron microscopy / Earl J. Kirkland
New York : Plenum Press , 1998
Electron microscopy 1966 / edited by Ryozi Uyeda
vol. 1,vol. 2. - Tokyo : Maruzen , c1966
Journal of electron microscopy
Vol. 22, no. 1 (1973)-v. 61, no. 6 (Dec. 2012). - Tokyo : Japanese Society of Electron Microscopy , 1973-c2012
雑誌
Scanning electron microscopy and X-ray microanalysis / Joseph I. Goldstein ... [et al.]
: [hbk]. - 4th ed. - New York : Springer Science+Business Media , 2018
Electron microscopy in molecular biology : a practical approach / edited by J. Sommerville and U. Scheer
: pbk. - Oxford : IRL , c1987. - (The practical approach series)
4D electron microscopy : imaging in space and time / Ahmed H. Zewail, John M. Thomas
: hbk,: pbk. - Hackensack, N.J. : Imperial College Press , c2010
Microscopy of semiconducting materials 1989 : proceedings of the Royal Microscopical Society conference held at Oxford University, 10-13 April 1989 / edited by A. G. Cullis and J. L. Hutchison
Bristol, England : Institute of Physics , c1989. - New York. - (Institute of Physics conference series ; no. 100)
Microscopy of semiconducting materials, 1987 : proceedings of the Institute of Physics Conference held at Oxford University, 6-8 April 1987 / edited by A. G. Cullis and P. D. Augustus
Bristol, England : Institute of Physics , c1987. - Philadelphia. - (Institute of Physics conference series ; no. 87)
Microscopy of semiconducting materials 1993 : proceedings of the Royal Microscopical Society conference held at Oxford University, 5-8 April 1993 / edited by A. G. Cullis, A. E. Staton-Bevan and J. L. Hutchison
Bristol, [England] : Institute of Physics , c1993. - (Institute of Physics conference series ; no. 134)
Microscopy and semiconducting materials 1995 : proceedings of the Institute of Physics conference held at Oxford University, 20-23 March 1995 / edited by A.G. Cullis and A.E. Staton-Bevan
Bristol : Institute of Physics Pub. , 1996. - Philadelphia. - (Institute of Physics conference series ; no. 146)
Electron microscopy and strength of crystals : proceedings of the first Berkeley International Materials Conference, "the impact of transmission electron microscopy on theories of the strength of crystals" held at the University of California, : Berkeley, July 5-8, 1961 / edited by Gareth Thomas, Jack Washburn
New York : Interscience Publishers , 1963, c1962
Handbook of instrumentation and techniques for semiconductor nanostructure characterization / editors, Richard Haight, Frances M. Ross, James B. Hannon
vol. 1,vol. 2,set. - Singapore : World Scientific , c2012. - (World scientific series in materials and energy / series editor, Leonard C. Feldman ; 1-2)