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検索キーワード:(著者名に左の語を含む: #Fuchs H.)
該当件数:12件
Characterization / Bharat Bhushan, Harald Fuchs (eds.)
Berlin : Springer , c2006. - (Nanoscience and technology ; . Applied scanning probe methods ; 3)
図書
Scanning probe microscopy techniques / Bharat Bhushan, Harald Fuchs (eds.)
Berlin : Springer , c2006. - (Nanoscience and technology ; . Applied scanning probe methods ; 2)
Industrial applications / Bharat Bhushan, Harald Fuchs (eds.)
Berlin : Springer , c2006. - (Nanoscience and technology ; . Applied scanning probe methods ; 4)
Biomimetics and industrial applications / Bharat Bhushan, Harald Fuchs (eds.)
Berlin : Springer , c2007. - (Nanoscience and technology ; . Applied scanning probe methods ; 7)
Scanning probe microscopy techniques / Bharat Bhushan [and] Harald Fuchs
Berlin : Springer , c2009. - (Nanoscience and technology ; . Applied scanning probe methods ; 11)
Characterization / Bharat Bhushan [and] Harald Fuchs
Berlin : Springer , c2009. - (Nanoscience and technology ; . Applied scanning probe methods ; 12)
Biomimetics and industrial applications / Bharat Bhushan [and] Harald Fuchs
Berlin : Springer , c2009. - (Nanoscience and technology ; . Applied scanning probe methods ; 13)
Applied scanning probe methods / Bharat Bhushan, Harald Fuchs, Sumio Hosaka [eds.]
Berlin ; New York : Springer , c2004. - (Nanoscience and technology)
Scanning probe microscopy techniques / Bharat Bhushan, Harald Fuchs, Masahiko Tomitori
Berlin : Springer , c2008. - (Nanoscience and technology ; . Applied scanning probe methods ; 8)
Characterization / Bharat Bhushan, Harald Fuchs, Masahiko Tomitori
Berlin : Springer , c2008. - (Nanoscience and technology ; . Applied scanning probe methods ; 9)
Biomimetics and industrial applications / Bharat Bhushan, Harald Fuchs, Masahiko Tomitori
Berlin : Springer , c2008. - (Nanoscience and technology ; . Applied scanning probe methods ; 10)
Scanning probe microscopy techniques / Bharat Bhushan, Harald Fuchs, Satoshi Kawata (eds.)
Berlin : Springer , c2007. - (Nanoscience and technology ; . Applied scanning probe methods ; 5)