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検索キーワード:(標準分類: TA417)
該当件数:9件
Scanning probe microscopy techniques / Bharat Bhushan, Harald Fuchs, Masahiko Tomitori
Berlin : Springer , c2008. - (Nanoscience and technology ; . Applied scanning probe methods ; 8)
図書
Characterization / Bharat Bhushan, Harald Fuchs, Masahiko Tomitori
Berlin : Springer , c2008. - (Nanoscience and technology ; . Applied scanning probe methods ; 9)
Biomimetics and industrial applications / Bharat Bhushan, Harald Fuchs, Masahiko Tomitori
Berlin : Springer , c2008. - (Nanoscience and technology ; . Applied scanning probe methods ; 10)
Scanning probe microscopy techniques / Bharat Bhushan [and] Harald Fuchs
Berlin : Springer , c2009. - (Nanoscience and technology ; . Applied scanning probe methods ; 11)
Characterization / Bharat Bhushan [and] Harald Fuchs
Berlin : Springer , c2009. - (Nanoscience and technology ; . Applied scanning probe methods ; 12)
Biomimetics and industrial applications / Bharat Bhushan [and] Harald Fuchs
Berlin : Springer , c2009. - (Nanoscience and technology ; . Applied scanning probe methods ; 13)
Atomistic modeling of materials failure / Markus J. Buehler
New York : Springer , c2008
Mechanical response of composites / Pedro P. Camanho ... [et al.]
: Springer , c2008. - (Computational methods in applied sciences / Eugenio Oñate ; v. 10)
Practical non-destructive testing / Baldev Raj, T. Jayakumar, M. Thavasimuthu
2nd ed. - New Delhi : Narosa Pub. House , c2002