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検索キーワード:(標準分類: TA417.23)
該当件数:18件
Characterization / Bharat Bhushan, Harald Fuchs (eds.)
Berlin : Springer , c2006. - (Nanoscience and technology ; . Applied scanning probe methods ; 3)
図書
Industrial applications / Bharat Bhushan, Harald Fuchs (eds.)
Berlin : Springer , c2006. - (Nanoscience and technology ; . Applied scanning probe methods ; 4)
Scanning probe microscopy techniques / Bharat Bhushan, Harald Fuchs, Satoshi Kawata (eds.)
Berlin : Springer , c2007. - (Nanoscience and technology ; . Applied scanning probe methods ; 5)
Characterization / Bharat Bhushan, Satoshi Kawata (eds.)
Berlin : Springer , c2007. - (Nanoscience and technology ; . Applied scanning probe methods ; 6)
Biomimetics and industrial applications / Bharat Bhushan, Harald Fuchs (eds.)
Berlin : Springer , c2007. - (Nanoscience and technology ; . Applied scanning probe methods ; 7)
Transmission electron microscopy and diffractometry of materials / Brent Fultz, James Howe
2nd ed. - Berlin : Springer , c2002. - Tokyo. - (Physics and astronomy online library)
3rd ed. - Berlin : Springer , 2008
Advances in acoustic microscopy / edited by Andrew Briggs
New York : Plenum , c1995
Advances in acoustic microscopy / edited by Andrew Briggs and Walter Arnold
New York : Plenum , c1996
Berlin : Springer , 2001. - Tokyo
Transmission electron microscopy / David B. Williams and C. Barry Carter
New York : Plenum Press , c1996
Atlas of backscattering Kikuchi diffraction patterns / D. J. Dingley, K. Z. Baba-Kishi, V. Randle
Bristol : Institute of Physics , c1995. - Philadelphia. - (Microscopy in materials science series)
Applied scanning probe methods / Bharat Bhushan, Harald Fuchs, Sumio Hosaka [eds.]
Berlin ; New York : Springer , c2004. - (Nanoscience and technology)
Structural and chemical analysis of materials : X-ray, electron and neutron diffraction, X-ray, electron and ion spectrometry, electron microscopy / J.P. Eberhart ; translated by J.P. Eberhart
: pbk. - Chichester, England ; New York : Wiley , c1991
Reflection electron microscopy and spectroscopy for surface analysis / Zhong Lin Wang
Cambridge ; New York : Cambridge University Press , 1996