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検索キーワード:(件名: #Microscopy)
該当件数:40件
Science of microscopy / edited by Peter W. Hawkes, John C.H. Spence
v. 1,v. 2. - New York, N.Y. : Springer , c2007
図書
Cell biological applications of confocal microscopy / edited by Brian Matsumoto
2nd ed. - San Diego : Academic Press , c2002. - Tokyo. - (Methods in cell biology / edited by David M. Prescott ; v. 70)
San Diego : Academic Press , c1993. - Tokyo. - (Methods in cell biology ; v. 38)
Handbook of nanoscopy / edited by Gustaaf van Tendeloo, Dirk van Dyck, and Stephen J. Pennycook
: set,v.1,v.2. - Weinheim : Wiley-VCH , c2012
Spin-stand microscopy of hard disk data / Isaak Mayergoyz, Chun Tse
Amsterdam : Elsevier , 2007. - (Elsevier series in electromagnetism)
Images of materials / edited by David B. Williams, Alan R. Pelton, Ronald Gronsky ; with a foreword by Sir Peter B. Hirsch
New York : Oxford Univ. Pr. , 1991
レーベンフックの手紙 / Clifford Dobell著 ; 天児和暢訳
福岡 : 九州大学出版会 , 2004.1
Applied scanning probe methods / Bharat Bhushan, Harald Fuchs, Sumio Hosaka [eds.]
Berlin ; New York : Springer , c2004. - (Nanoscience and technology)
Characterization / Bharat Bhushan, Harald Fuchs (eds.)
Berlin : Springer , c2006. - (Nanoscience and technology ; . Applied scanning probe methods ; 3)
Scanning probe microscopy techniques / Bharat Bhushan, Harald Fuchs (eds.)
Berlin : Springer , c2006. - (Nanoscience and technology ; . Applied scanning probe methods ; 2)
Industrial applications / Bharat Bhushan, Harald Fuchs (eds.)
Berlin : Springer , c2006. - (Nanoscience and technology ; . Applied scanning probe methods ; 4)
Scanning probe microscopy techniques / Bharat Bhushan, Harald Fuchs, Satoshi Kawata (eds.)
Berlin : Springer , c2007. - (Nanoscience and technology ; . Applied scanning probe methods ; 5)
Characterization / Bharat Bhushan, Satoshi Kawata (eds.)
Berlin : Springer , c2007. - (Nanoscience and technology ; . Applied scanning probe methods ; 6)
Advances in acoustic microscopy / edited by Andrew Briggs
New York : Plenum , c1995
Advances in acoustic microscopy / edited by Andrew Briggs and Walter Arnold
New York : Plenum , c1996
Scanning probe microscopy in nanoscience and nanotechnology / Bharat Bhushan, editor
v. 3. - Berlin ; London : Springer , c2013. - (Nanoscience and technology)
Structural and chemical analysis of materials : X-ray, electron and neutron diffraction, X-ray, electron and ion spectrometry, electron microscopy / J.P. Eberhart ; translated by J.P. Eberhart
: pbk. - Chichester, England ; New York : Wiley , c1991
Transmission electron microscopy / David B. Williams and C. Barry Carter
New York : Plenum Press , c1996
Advanced optical imaging theory / Min Gu
Berlin : Springer , c2000. - (Springer series in optical sciences ; v. 75)
Scanning probe microscopy of functional materials : nanoscale imaging and spectroscopy / Sergei V. Kalinin, Alexei Gruverman, editors
New York : Springer , c2010
Transmission electron microscopy and diffractometry of materials / Brent Fultz, James Howe
2nd ed. - Berlin : Springer , c2002. - Tokyo. - (Physics and astronomy online library)
Nano and microstructural design of advanced materials : a commemorative volume on Professor G. Thomas' seventieth birthday / edited by M. A. Meyers, R. O. Ritchie, and M. Sarikaya
Amsterdam : Elsevier , 2003. - Boston
3rd ed. - Berlin : Springer , 2008
Berlin : Springer , 2001. - Tokyo
顕微鏡の使い方ノート : 光学顕微鏡からCCDカメラまで / 野島博編集
東京 : 羊土社 , 1997.12. - (無敵のバイオテクニカルシリーズ ; 7)
Magnetic Microscopy of Layered Structures
Aufl. 2014. - Berlin : Springer Berlin , 2014. - (Springer Series in Surface Sciences ; 57)
Scanning probe microscopy techniques / Bharat Bhushan, Harald Fuchs, Masahiko Tomitori
Berlin : Springer , c2008. - (Nanoscience and technology ; . Applied scanning probe methods ; 8)
Characterization / Bharat Bhushan, Harald Fuchs, Masahiko Tomitori
Berlin : Springer , c2008. - (Nanoscience and technology ; . Applied scanning probe methods ; 9)
Biomimetics and industrial applications / Bharat Bhushan, Harald Fuchs, Masahiko Tomitori
Berlin : Springer , c2008. - (Nanoscience and technology ; . Applied scanning probe methods ; 10)
Scanning probe microscopy techniques / Bharat Bhushan [and] Harald Fuchs
Berlin : Springer , c2009. - (Nanoscience and technology ; . Applied scanning probe methods ; 11)
Characterization / Bharat Bhushan [and] Harald Fuchs
Berlin : Springer , c2009. - (Nanoscience and technology ; . Applied scanning probe methods ; 12)
Biomimetics and industrial applications / Bharat Bhushan [and] Harald Fuchs
Berlin : Springer , c2009. - (Nanoscience and technology ; . Applied scanning probe methods ; 13)
Atlas of backscattering Kikuchi diffraction patterns / D. J. Dingley, K. Z. Baba-Kishi, V. Randle
Bristol : Institute of Physics , c1995. - Philadelphia. - (Microscopy in materials science series)
Reflection electron microscopy and spectroscopy for surface analysis / Zhong Lin Wang
Cambridge ; New York : Cambridge University Press , 1996
The image processing handbook / John C. Russ
: hardback. - 6th ed. - Boca Raton, Fla. : CRC Press , c2011
Semiconductor device and failue analysis using photon emission microscopy / Wai Kin Chim
Chichester, [England] : John Wiley , 2000. - New York
The European physical journal. Applied physics : EPJ / recognized by the European Physical Society
Vol. 1, no. 1 (Jan. 1998)-. - Strasbourg : EDP Sciences , 1998-
雑誌