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検索キーワード:(件名: #Scanning probe microscopy)
該当件数:22件
Scanning probe microscopy : the lab on a tip / Ernst Meyer, Hans Josef Hug, Roland Bennewitz
Berlin : Springer , c2004. - (Advanced texts in physics ; .). - (Physics and astronomy online library ; .)
図書
Scanning probe microscopy : analytical methods / Roland Wiesendanger
Berlin : Springer-Verlag , c1998. - (Nanoscience and technology)
Procedures in scanning probe microscopies / editors, Richard J. Colton ... [et al.]
Chichester : Wiley , c1998
Scanning probe microscopy techniques / Bharat Bhushan, Harald Fuchs, Masahiko Tomitori
Berlin : Springer , c2008. - (Nanoscience and technology ; . Applied scanning probe methods ; 8)
Characterization / Bharat Bhushan, Harald Fuchs, Masahiko Tomitori
Berlin : Springer , c2008. - (Nanoscience and technology ; . Applied scanning probe methods ; 9)
Biomimetics and industrial applications / Bharat Bhushan, Harald Fuchs, Masahiko Tomitori
Berlin : Springer , c2008. - (Nanoscience and technology ; . Applied scanning probe methods ; 10)
Scanning probe microscopy techniques / Bharat Bhushan [and] Harald Fuchs
Berlin : Springer , c2009. - (Nanoscience and technology ; . Applied scanning probe methods ; 11)
Characterization / Bharat Bhushan [and] Harald Fuchs
Berlin : Springer , c2009. - (Nanoscience and technology ; . Applied scanning probe methods ; 12)
Biomimetics and industrial applications / Bharat Bhushan [and] Harald Fuchs
Berlin : Springer , c2009. - (Nanoscience and technology ; . Applied scanning probe methods ; 13)
Acoustic scanning probe microscopy / Francesco Marinello, Daniele Passeri, Enrico Savio, editors
hbk.,hbk.. - Berlin ; London : Springer , c2013. - (Nanoscience and technology)
Theory of STM and related scanning probe methods / R. Wiesendanger, H.-J. Güntherodt (eds.)
Berlin : Springer-Verlag , c1993. - New York. - (Springer series in surface sciences ; 29 . Scanning tunneling microscopy ; 3)
Scanning probe microscopy and spectroscopy : methods and applications / Roland Wiesendanger
Cambridge : Cambridge Univ. Pr. , 1994. - New York
2nd ed. - Berlin : Springer , c1996. - New York. - (Springer series in surface sciences ; 29 . Scanning tunneling microscopy ; 3)
Applied scanning probe methods / Bharat Bhushan, Harald Fuchs, Sumio Hosaka [eds.]
Berlin ; New York : Springer , c2004. - (Nanoscience and technology)
Characterization / Bharat Bhushan, Harald Fuchs (eds.)
Berlin : Springer , c2006. - (Nanoscience and technology ; . Applied scanning probe methods ; 3)
Scanning probe microscopy techniques / Bharat Bhushan, Harald Fuchs (eds.)
Berlin : Springer , c2006. - (Nanoscience and technology ; . Applied scanning probe methods ; 2)
Industrial applications / Bharat Bhushan, Harald Fuchs (eds.)
Berlin : Springer , c2006. - (Nanoscience and technology ; . Applied scanning probe methods ; 4)
Scanning probe microscopy techniques / Bharat Bhushan, Harald Fuchs, Satoshi Kawata (eds.)
Berlin : Springer , c2007. - (Nanoscience and technology ; . Applied scanning probe methods ; 5)
Characterization / Bharat Bhushan, Satoshi Kawata (eds.)
Berlin : Springer , c2007. - (Nanoscience and technology ; . Applied scanning probe methods ; 6)
Atom probe microscopy / Baptiste Gault ... [et al.]
New York : Springer , c2012. - (Springer series in materials science ; 160)
Scanning probe microscopy in nanoscience and nanotechnology / Bharat Bhushan, editor
v. 3. - Berlin ; London : Springer , c2013. - (Nanoscience and technology)
Scanning probe microscopy of functional materials : nanoscale imaging and spectroscopy / Sergei V. Kalinin, Alexei Gruverman, editors
New York : Springer , c2010