東北学院大学の蔵書(電子ブックを含む)を検索します。
日本国内の大学図書館等が所蔵する資料を検索します。
日本国内の学術論文等を検索します。
日本国内の学術機関が公開する学術成果(学位論文、紀要、学術論文等)を検索します。
※現在メンテナンス中のため、https://ndlsearch.ndl.go.jp/ にアクセスの上、検索してください。
検索キーワード:(件名: Materials Microscopy)
該当件数:30件
Structural and chemical analysis of materials : X-ray, electron and neutron diffraction, X-ray, electron and ion spectrometry, electron microscopy / J.P. Eberhart ; translated by J.P. Eberhart
: pbk. - Chichester, England ; New York : Wiley , c1991
図書
Applied scanning probe methods / Bharat Bhushan, Harald Fuchs, Sumio Hosaka [eds.]
Berlin ; New York : Springer , c2004. - (Nanoscience and technology)
Scanning probe microscopy techniques / Bharat Bhushan, Harald Fuchs (eds.)
Berlin : Springer , c2006. - (Nanoscience and technology ; . Applied scanning probe methods ; 2)
Scanning probe microscopy of functional materials : nanoscale imaging and spectroscopy / Sergei V. Kalinin, Alexei Gruverman, editors
New York : Springer , c2010
Scanning probe microscopy in nanoscience and nanotechnology / Bharat Bhushan, editor
v. 3. - Berlin ; London : Springer , c2013. - (Nanoscience and technology)
Reflection electron microscopy and spectroscopy for surface analysis / Zhong Lin Wang
Cambridge ; New York : Cambridge University Press , 1996
Images of materials / edited by David B. Williams, Alan R. Pelton, Ronald Gronsky ; with a foreword by Sir Peter B. Hirsch
New York : Oxford Univ. Pr. , 1991
Advances in acoustic microscopy / edited by Andrew Briggs
New York : Plenum , c1995
Advances in acoustic microscopy / edited by Andrew Briggs and Walter Arnold
New York : Plenum , c1996
Characterization / Bharat Bhushan, Harald Fuchs (eds.)
Berlin : Springer , c2006. - (Nanoscience and technology ; . Applied scanning probe methods ; 3)
Industrial applications / Bharat Bhushan, Harald Fuchs (eds.)
Berlin : Springer , c2006. - (Nanoscience and technology ; . Applied scanning probe methods ; 4)
Scanning probe microscopy techniques / Bharat Bhushan, Harald Fuchs, Satoshi Kawata (eds.)
Berlin : Springer , c2007. - (Nanoscience and technology ; . Applied scanning probe methods ; 5)
Characterization / Bharat Bhushan, Satoshi Kawata (eds.)
Berlin : Springer , c2007. - (Nanoscience and technology ; . Applied scanning probe methods ; 6)
Transmission electron microscopy / David B. Williams and C. Barry Carter
New York : Plenum Press , c1996
Nano and microstructural design of advanced materials : a commemorative volume on Professor G. Thomas' seventieth birthday / edited by M. A. Meyers, R. O. Ritchie, and M. Sarikaya
Amsterdam : Elsevier , 2003. - Boston
Scanning probe microscopy techniques / Bharat Bhushan, Harald Fuchs, Masahiko Tomitori
Berlin : Springer , c2008. - (Nanoscience and technology ; . Applied scanning probe methods ; 8)
Characterization / Bharat Bhushan, Harald Fuchs, Masahiko Tomitori
Berlin : Springer , c2008. - (Nanoscience and technology ; . Applied scanning probe methods ; 9)
Biomimetics and industrial applications / Bharat Bhushan, Harald Fuchs, Masahiko Tomitori
Berlin : Springer , c2008. - (Nanoscience and technology ; . Applied scanning probe methods ; 10)
Scanning probe microscopy techniques / Bharat Bhushan [and] Harald Fuchs
Berlin : Springer , c2009. - (Nanoscience and technology ; . Applied scanning probe methods ; 11)
Characterization / Bharat Bhushan [and] Harald Fuchs
Berlin : Springer , c2009. - (Nanoscience and technology ; . Applied scanning probe methods ; 12)
Biomimetics and industrial applications / Bharat Bhushan [and] Harald Fuchs
Berlin : Springer , c2009. - (Nanoscience and technology ; . Applied scanning probe methods ; 13)
Transmission electron microscopy and diffractometry of materials / Brent Fultz, James Howe
2nd ed. - Berlin : Springer , c2002. - Tokyo. - (Physics and astronomy online library)
3rd ed. - Berlin : Springer , 2008
Berlin : Springer , 2001. - Tokyo
Atlas of backscattering Kikuchi diffraction patterns / D. J. Dingley, K. Z. Baba-Kishi, V. Randle
Bristol : Institute of Physics , c1995. - Philadelphia. - (Microscopy in materials science series)
Principles of nano-optics / Lukas Novotny, Bert Hecht
Cambridge : Cambridge Univ. Pr. , 2006
Highlights in condensed matter physics and future prospects / edited by Leo Esaki
New York : Plenum Pr. , c1991. - (NATO ASI series ; Series B . Physics ; v. 285)